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TW303S

製品カタログ

Custom multiple output power supply
for “ Scanning electron microscope
with thermal electron-gun (tungsten)” .

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ドキュメント名 TW303S
ドキュメント種別 製品カタログ
ファイルサイズ 38.3Kb
取り扱い企業 フューテックス株式会社 (この企業の取り扱いカタログ一覧)

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Page1

Model : TW303S Custom multiple output power supply for “ Scanning electron microscope with thermal electron-gun (tungsten)” . Application ・Scanning electron microscope ・Electron probe micro analyzer This photograph is a production example. ・Auger micro probe analyzer Product specifications Input voltage This is a product only for the 90V~240VAC single phase 1.5A(50,60HZ) Accelerator supply (Referenced to GND) custom order that supplies Output voltage: -1K~-30kV OEM according to customer's Absolute voltage accuracy: Less than 0.1% system. Set ability: 12bit (10V LSB) Output current: 200μA max Ripple noise: 250mVp-p or less The other specifications Stability: 100ppm/1hr after 1hr warm up All the outputs provide with the over voltage temperature coefficient: 50ppm/℃ protection and the over current protection. Filament supply (Referenced to Accelerator) Output voltage: 0~5V External control: Optical isolated RS232C Set ability: 12bit (1mA LSB) Interlock: vacuum, thermo, HV-connection Output current: 0~3.3A HV connector: Customer specification Ripple noise: Less than 10mA @3A Output monitor: Accelerating voltage Absolute current accuracy: ±0.01A Storage temp range: -5℃~ +40℃ Stability: 200ppm/1hour @ 3.0A Operating temperature temperature coefficient: 100ppm/℃@3.0A or less Limit: +10℃~ +40℃ Bias Supply Humidity: 80% or less Insulation method: Air insulation (one molding) Output voltage: 3.0kV max Externals size: --- (W) × --- (D) × --- (H) Method of bias: active bias or self bias Weight: --- kg ・Details decides it by the consultation with the customer. The model “TW303S” is an integrated ・Each parameter can be changed according to your demands. multiple output high voltage power ・Please tell it to us if you need a small product. supply specifically developed for We can comply to the request. thermal electron-gun type scanning electron microscope. * Please ask details. e-mail info@futex.jp FUTEX CO., LTD. http://www.futex.jp TEL:+81-42-549-2888 FAX:+81-42-549-2900 2-28-3 Fukujima-cho Akishima Tokyo, Japan Update: Nov,30, 2011