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16-Bit, 16-Channel, 500 kSPS/1 MSPS, Easy Drive Multiplexed SAR ADC
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ドキュメント名 | Data Sheet AD4695/AD4696 |
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ドキュメント種別 | 製品カタログ |
ファイルサイズ | 4.6Mb |
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Page1
Features、Applications、General Description
Data Sheet
AD4695/AD4696
16-Bit, 16-Channel, 500 kSPS/1 MSPS, Easy Drive Multiplexed SAR ADC
FEATURES GENERAL DESCRIPTION
► Easy Drive The AD4695/AD4696 are compact, high accuracy, low power, 16-
► Reduced analog input and reference drive requirements channel, 16-bit, 500 kSPS/1 MSPS, multiplexed input precision,
► On-chip reference buffer (WLCSP only) successive approximation register (SAR) analog-to-digital convert-
► Overvoltage protection up to 5 mA on each analog input ers (ADCs) with Easy Drive features and extensive digital function-
ality.
► Long acquisition phase, ≥71.5% (715 ns/1000 ns) of cycle
time at 1 MSPS The AD4695/AD4696 are optimal for use in space constrained,
► High performance multichannel, precision data acquisition systems and monitoring
► Sample rate: 500 kSPS (AD4695) or 1 MSPS (AD4696) circuits. The AD4695/AD4696 feature a true 16-bit SAR ADC core
INL: ±1.0 LSB maximum with no missing codes, a 16-channel, low crosstalk multiplexer, a
► flexible channel sequencer, overvoltage protection clamp circuits on
► Guaranteed 16-bit, no missing codes each analog input, on-chip oversampling and decimation, threshold
► SINAD: 93 dB typical, fIN = 1 kHz detection and alert indicators, and an autonomous conversion (au-
► Oversampled dynamic range: 111.2 dB, OSR = 64 tocycle) mode.
► Small footprint, high channel density The AD4695/AD4696 Easy Drive features relax the drive require-
► 32-lead 5 mm × 5 mm LFCSP ments of the analog front end (AFE) and reference circuitry. Analog
► 36-ball 2.96 mm × 2.96 mm WLCSP input high-Z mode and reference input high‑Z mode simplify system
► Easy Drive features support system level designs with fewer designs, reduce component count, and increase channel density
components by removing the need for dedicated high speed ADC drivers and
► Enhanced digital functionality reference buffers. The WLCSP option of the AD4695/AD4696 in-
► First conversion accurate, no latency or pipeline delay cludes an internal reference buffer, which provides a true, buffered
► Fast conversion time and dual-/quad-SDO modes allow low reference input.
SPI clock rates Input overvoltage protection clamps on each analog input protect
► Customizable channel sequencer the AD4695/AD4696 from overvoltage events and prevent overvolt-
► On-chip oversampling and decimation age events on one channel from degrading performance on other
Threshold detection alerts channels (see Figure 27).
►
► Offset and gain correction Advanced digital functionality makes the AD4695/AD4696 compati-
► Autonomous conversion (autocycle) mode ble with a variety of low power digital hosts. The low serial periph-
1.14 V to 1.98 V logic SPI eral interface (SPI) clock rate requirements, on-chip customizable
► channel sequencers, and oversampling and decimation reduce the
► Low power burden on the digital host system. Autocycle mode and threshold
► 8 mW at fS = 1 MSPS and 4 mW at fS = 500 kSPS detection features enable low power, interrupt driven firmware de-
► 4 µW standby power dissipation with the internal LDO disa- sign by performing conversions autonomously and generating alerts
bled based on channel specific threshold limits.
► Internal LDO enables 3.15 V to 5.5 V, single analog supply
operation The AD4695/AD4696 are available in a 5 mm × 5 mm 32-lead
lead frame chip scale package (LFCSP) and a 2.96 mm × 2.96
► Wide operating temperature range: −40°C to +125°C mm 36-ball wafer level chip scale package (WLCSP) with operation
APPLICATIONS specified from −40°C to +125°C.
► Photodiode monitoring
► Medical instrumentation
► Vital signs monitoring
► Electronic test and measurement
► Automated test equipment
► Instrumentation and process control
► Battery-powered equipment
Rev. A
DOCUMENT FEEDBACK Information furnished by Analog Devices is believed to be accurate and reliable "as is". However, no responsibility is assumed by Analog
Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to
change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and
TECHNICAL SUPPORT registered trademarks are the property of their respective owners.
Page2
Data Sheet AD4695/AD4696
TABLE OF CONTENTS
Features................................................................ 1 Channel Sequencing Modes............................ 41
Applications........................................................... 1 Digital Interface....................................................46
General Description...............................................1 Register Configuration Mode............................46
Functional Block Diagram......................................5 Conversion Mode............................................. 53
Specifications........................................................ 6 Autocycle Mode................................................60
Timing Specifications........................................11 General-Purpose Pins......................................62
Absolute Maximum Ratings.................................13 Device Reset....................................................63
Thermal Resistance......................................... 13 Applications Information...................................... 66
Electrostatic Discharge (ESD) Ratings.............13 Analog Front-End Design.................................67
ESD Caution.....................................................13 Analog Input Overvoltage Protection................70
Pin Configuration and Function Descriptions...... 14 Reference Circuitry Design.............................. 70
Typical Performance Characteristics................... 17 Optimizing Reference Buffer Startup................72
Terminology......................................................... 27 Converting Between Codes and Volts..............73
Theory of Operation.............................................28 Oversampling for Noise Reduction...................73
Overview.......................................................... 28 Digital Interface Operation................................73
Converter Operation.........................................28 Device Configuration Recommendations.........80
Transfer Function............................................. 30 Effective Channel Sample Rate....................... 81
Analog Inputs................................................... 32 Layout Guidelines.............................................83
Input Overvoltage Protection Clamps...............35 Evaluating AD4695/AD4696 Performance.......84
Temperature Sensor.........................................36 Register Information............................................ 85
Voltage Reference Input...................................36 Register Overview............................................85
Power Supplies................................................ 37 Register Details................................................86
Oversampling and Decimation......................... 38 Outline Dimensions........................................... 106
Offset and Gain Correction...............................39 Ordering Guide ..............................................106
Threshold Detection and Alert Indicators......... 39 Evaluation Boards.......................................... 107
Busy Indicator...................................................41
REVISION HISTORY
5/2022—Rev. 0 to Rev. A
Added 36-Ball WLCSP.....................................................................................................................................1
Changed Master to Host and 0x0xx to 0x00xx Throughout.............................................................................1
Changes to Features Section.......................................................................................................................... 1
Changes to General Description Section.........................................................................................................1
Changes to Figure 1........................................................................................................................................ 5
Changes to Specifications Section and Table 1...............................................................................................6
Added Note 6 and Note 7, Table 1; Renumbered Sequentially....................................................................... 6
Changes to Timing Specifications Section.....................................................................................................11
Changes to Reference Inputs Parameter, Table 3.........................................................................................13
Changes to Thermal Resistance Section and Table 4...................................................................................13
Added Table 6, Renumbered Sequentially.....................................................................................................13
Changes to Table 7........................................................................................................................................14
Added Figure 3 and Table 8; Renumbered Sequentially .............................................................................. 15
Changes to Typical Performance Characteristics Section.............................................................................17
Changes to Overview Section........................................................................................................................28
Changes to Figure 68 Caption to Figure 70 Caption..................................................................................... 33
Changes to Analog Input High-Z Mode Section.............................................................................................33
Changes to Overvoltage Reduced Current Mode Section.............................................................................35
Changes to Temperature Sensor Section......................................................................................................36
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Page3
Data Sheet AD4695/AD4696
TABLE OF CONTENTS
Changes to Voltage Reference Input Section................................................................................................36
Changes to Reference Input High-Z Mode Section....................................................................................... 36
Added Internal Reference Buffer Section...................................................................................................... 37
Changes to Power Supplies Section..............................................................................................................37
Changes to Internal LDO Section.................................................................................................................. 38
Changes to Oversampling and Decimation Section...................................................................................... 38
Changes to Offset and Gain Correction Section and Table 14...................................................................... 39
Changes to Threshold Detection and Alert Indicators Section...................................................................... 39
Changes to Alert Indicator Registers Section................................................................................................ 39
Changed Alert Indicator on BSY_ALT_GP0 Section to Alert Indicator on General-Purpose Pins Section....40
Changes to Alert Indicator on General-Purpose Pins Section.......................................................................40
Changes to Busy Indicator Section................................................................................................................41
Changes to Busy Indicator on Serial Data Outputs Section.......................................................................... 41
Changed Busy Indicator on BSY_ALT_GP0 Section to Busy Indicator on General-Purpose Pins Section...41
Changes to Busy Indicator on General-Purpose Pins Section...................................................................... 41
Changes to Channel Sequencing Modes Section......................................................................................... 41
Moved Table 15..............................................................................................................................................42
Changes to Standard Sequencer Section......................................................................................................42
Changes to Advanced Sequencer Section.................................................................................................... 42
Change to Two-Cycle Command Mode Section............................................................................................43
Changes to Single-Cycle Command Mode Section.......................................................................................43
Changes to Figure 79 and Figure 80............................................................................................................. 45
Changes to Digital Interface Section..............................................................................................................46
Changes to Multibyte Register Access Section............................................................................................. 47
Changes to Streaming Mode Section............................................................................................................ 48
Changes to Single Instruction Mode Section.................................................................................................48
Changes to Checksum Protection Section.................................................................................................... 50
Changes to Conversion Mode Section.......................................................................................................... 53
Changes to Serial Data Output Modes Section, Table 19, and Table 20.......................................................54
Added Table 23..............................................................................................................................................55
Changes to Conversion Mode Timing Diagrams Section.............................................................................. 55
Added Figure 98 and Figure 99..................................................................................................................... 59
Changes to Autocycle Mode Section.............................................................................................................60
Changes to General-Purpose Pins Section and Table 25..............................................................................62
Changes to GPIO Section..............................................................................................................................63
Change to Device Reset Section...................................................................................................................63
Changes to Figure 112...................................................................................................................................66
Changes to External RC Filter Section.......................................................................................................... 67
Changes to Guidelines for Driver Amplifier Selection Section and Table 26 Title..........................................69
Changes to Analog Input Overvoltage Protection Section ............................................................................70
Changes to Reference Circuitry Design Section............................................................................................70
Changes to Reference Circuit Design for Driving REF Input Section............................................................70
Added Reference Circuit Design for Internal Reference Buffer Section........................................................ 72
Added Optimizing Reference Buffer Startup Section.....................................................................................72
Added Reference Buffer Startup with Bypass Option Section....................................................................... 72
Added Reference Buffer Startup with Boost Mode Section........................................................................... 73
Changes to SPI Peripheral Connections Section, Figure 118, and Figure 119............................................. 74
Added Figure 120.......................................................................................................................................... 75
Changes to SPI Peripheral Synchronization in Conversion Mode Section....................................................75
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Page4
Data Sheet AD4695/AD4696
TABLE OF CONTENTS
Changes to Figure 121 and Figure 122......................................................................................................... 76
Changes to Figure 123 and Figure 124......................................................................................................... 77
Added Figure 125.......................................................................................................................................... 78
Changes to SPI Peripheral Synchronization in Autocycle Mode Section...................................................... 78
Changes to Conversion Mode SPI Clock Frequency Requirements Section and Table 28...........................79
Changes to Device Configuration Recommendations Section...................................................................... 80
Changes to Effective Channel Sample Rate Section.....................................................................................81
Changes to Layout Guidelines Section..........................................................................................................83
Changes to Reference Control Register Figure and Table 49....................................................................... 96
Changes to GPIO Enable Register Figure and Table 53............................................................................... 99
Changes to General-Purpose Pin Function Control Register Figure and Table 54..................................... 100
Changes to Table 55....................................................................................................................................101
Updated Outline Dimensions....................................................................................................................... 106
Changes to Ordering Guide.........................................................................................................................106
Added Evaluation Boards............................................................................................................................ 107
12/2020—Revision 0: Initial Version
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Page5
Functional Block Diagram
Data Sheet AD4695/AD4696
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
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Page6
Specifications
Data Sheet AD4695/AD4696
SPECIFICATIONS
AVDD = 3.15 V to 5.5 V, LDO_IN = 2.4 V to 5.5 V with internal LDO enabled, LDO_IN = AGND with internal low dropout (LDO) disabled,
VDD = 1.71 V to 1.89 V with internal LDO disabled, VIO = 1.14 V to 1.98 V, AGND = REFGND = IOGND = 0 V, reference voltage (VREF)
= 2.4 V to 5.1 V, REF = VREF with internal reference buffer disabled, REFIN = VREF with internal reference buffer enabled, reference buffer
boost mode enabled, sample rate (fS) = 1 MSPS for the AD4696, fS = 500 kSPS for the AD4695, input frequency (fIN) = 1 kHz, digital output
load capacitance = 20 pF, autocycle mode disabled, analog input high-Z mode enabled, reference input high-Z mode enabled, busy indicator
and alert indicator not enabled on general-purpose pins, no active overvoltage protection clamps, and TA = −40°C to +125°C, unless otherwise
noted.
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
RESOLUTION 16 Bits
ANALOG INPUT1, 2
Input Voltage Range Positive ADC input voltage (IN+) – negative ADC input
voltage (IN−)
Unipolar Mode 0 +VREF V
Pseudobipolar Mode −VREF/2 +VREF/2 V
Operating Input Voltage
IN+ − REFGND IN− = REFGND 0 +VREF V
IN− = COM, odd numbered input −0.1 VREF + 0.1 V
IN− − REFGND IN− = COM, odd numbered input
Unipolar mode −0.1 VREF + 0.1 V
Pseudobipolar mode VREF/2 – 0.1 VREF/2 VREF/2 + 0.1 V
Common-Mode Rejection Ratio (CMRR) fIN = 250 kHz, IN− = COM, odd numbered input 69.5 dB
Analog Input Leakage Current3 10 nA
SAMPLING DYNAMICS
Sample Rate Autocycle mode disabled
AD4695 500 kSPS
AD4696 1 MSPS
Autocycle Sample Period Autocycle mode enabled
AC_CYC = 0x0 8.5 10 11.5 μs
AC_CYC = 0x1 17 20 23 μs
AC_CYC = 0x2 34 40 46 μs
AC_CYC = 0x3 68 80 92 μs
AC_CYC = 0x4 85 100 115 μs
AC_CYC = 0x5 170 200 230 μs
AC_CYC = 0x6 340 400 460 μs
AC_CYC = 0x7 680 800 920 μs
Aperture Delay 2 ns
Aperture Jitter 0.5 ps rms
DC ACCURACY
No Missing Codes 16 Bits
Integral Nonlinearity Error (INL) VREF = 5 V, oversampling ratio (OSR) = 1
LFCSP, TA = −40°C to +125°C −1 ±0.4 +1 LSB
WLCSP, TA = 0°C to +70°C −2 ±0.4 +2 LSB
WLCSP, TA = −40°C to +125°C −2.5 ±0.4 +2.5 LSB
Differential Nonlinearity Error (DNL) VREF = 5 V, OSR = 1 −0.6 ±0.3 +0.6 LSB
Transition Noise VREF = 5 V 0.5 LSB rms
Offset Error4 VREF = 5 V
TA = 25°C ±0.03 mV
TA = −40°C to +125°C −0.43 +0.43 mV
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Page7
Data Sheet AD4695/AD4696
SPECIFICATIONS
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
Offset Error Match4 VREF = 5 V
TA = 25°C ±0.025 mV
TA = −40°C to +125°C −0.23 +0.23 mV
Gain Error4 VREF = 5 V
TA = 25°C ±0.001 %FS5
TA = −40°C to +125°C −0.025 +0.025 %FS
Gain Error Match4 VREF = 5 V
TA = 25°C ±0.002 %FS
TA = −40°C to +125°C −0.012 +0.012 %FS
AC PERFORMANCE
Dynamic Range VREF = 5 V
OSR = 1 93.4 dB
OSR = 4 99.3 dB
OSR = 16 105.3 dB
OSR = 64 111.2 dB
Input RMS Noise OSR = 1 37.8 μV rms
OSR = 4 19.2 μV rms
OSR = 16 9.6 μV rms
OSR = 64 4.9 μV rms
1/f Noise Bandwidth = 0.1 Hz to 10 Hz 5 μV p-p
Signal-to-Noise Ratio (SNR) VREF = 5 V, fIN = 1 kHz 91.25 93 dB
VREF = 4.096 V, fIN = 1 kHz 91.3 dB
VREF = 2.5 V, fIN = 1 kHz 87 dB
Total Harmonic Distortion (THD) VREF = 5 V, fIN = 1 kHz −117 dB
VREF = 4.096 V, fIN = 1 kHz −117.5 dB
VREF = 2.5 V, fIN = 1 kHz −119 dB
Signal-to-Noise-and-Distortion (SINAD)
LFCSP VREF = 5 V, fIN = 1 kHz 91.1 93 dB
VREF = 4.096 V, fIN = 1 kHz 91.3 dB
VREF = 2.5 V, fIN = 1 kHz 87 dB
WLCSP VREF = 5 V, fIN = 1 kHz 89 93 dB
Spurious-Free Dynamic Range (SFDR) VREF = 5 V 121 dB
Channel to Channel Isolation fIN = 100 kHz
LFCSP option −123 dB
WLCSP option −120 dB
Channel to Channel Memory fIN = 100 kHz, fS = 1 MSPS −100 dB
fIN = 100 kHz, fS = 500 kSPS −110 dB
−3 dB Input Bandwidth 11.7 MHz
REFERENCE INPUT6
VREF Range REF input, internal reference buffer disabled 2.4 AVDD + 0.25 V
REFIN input, internal reference buffer disabled REF
REFIN input, internal reference buffer enabled 2.4 AVDD – 0.3 V
REF Leakage Current VREF = 5 V
LFCSP No active overvoltage protection clamps 165 nA
All clamps active, overvoltage reduced, current mode 375 μA
disabled
All clamps active, overvoltage reduced, current mode 8 μA
enabled
WLCSP Internal reference buffer disabled 165 nA
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Page8
Data Sheet AD4695/AD4696
SPECIFICATIONS
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
REF Average Input Current VREF = AVDD = 5 V, internal reference buffer disabled
Reference High-Z Mode Disabled fS = 10 kSPS, unipolar mode 3.3 μA
fS = 500 kSPS, unipolar mode 160 μA
fS = 1 MSPS, unipolar mode 320 µA
fS = 10 kSPS, pseudobipolar mode 4.0 μA
fS = 500 kSPS, pseudobipolar mode 195 μA
fS = 1 MSPS, pseudobipolar mode 390 µA
Reference High-Z Mode Enabled fS = 10 kSPS, unipolar mode 0.3 μA
fS = 500 kSPS, unipolar mode 6 μA
fS = 1 MSPS, unipolar mode 12 μA
fS = 10 kSPS, pseudobipolar mode 0.4 μA
fS = 500 kSPS, pseudobipolar mode 11 μA
fS = 1 MSPS, pseudobipolar mode 22 µA
REFIN Current VREF = 5 V
Internal Reference Buffer Enabled No active overvoltage protection clamps 16 nA
All clamps active, overvoltage reduced, current mode 200 µA
disabled
All clamps active, overvoltage reduced, current mode 4.5 µA
enabled
REFIN Input Capacitance WLCSP, internal reference buffer enabled 50 pF
Internal Reference Buffer Output Current Limit Reference buffer boost mode disabled 3.5 mA
Reference buffer boost mode enabled 11 mA
Internal Reference Buffer Turn-On Time7 (tREFBUF) VREF = 5 V
Reference Buffer Boost Mode Disabled REF decoupling capacitor (CREF = 1 µF) 10 ms
CREF = 10 µF 80 ms
Reference Buffer Boost Mode Enabled CREF = 1 µF 1.2 ms
CREF = 10 µF 10 ms
TEMPERATURE SENSOR
Temperature Sensor Voltage TA = 25°C 680 mV
TA = 0°C 725 mV
Temperature Sensitivity TA = −40°C to +125°C −1.8 mV/°C
OVERVOLTAGE CLAMP
External Series Resistance (R 8
EXT) For stable clamp operation
Overvoltage reduced current mode disabled 2000 Ω
Overvoltage reduced current mode enabled 1000 Ω
External Series Capacitance (C )8
EXT For stable clamp operation 500 pF
Clamp Input Current For each active clamp 5 mA
Clamp Activation Voltage VREF + 0.55 V
Clamp Deactivation Voltage VREF + 0.1 V
Input Clamping Voltage Clamp current = 5 mA VREF + 0.2 V
Activation Time 50 ns
Deactivation Time 100 ns
DIGITAL INPUTS
Logic Levels
Input Low Voltage (VIL) −0.3 +0.3 × VIO V
Input High Voltage (VIH) 0.7 × VIO 3.6 V
Input Current (IL) −1 +1 µA
Input Pin Capacitance 5 pF
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Page9
Data Sheet AD4695/AD4696
SPECIFICATIONS
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
DIGITAL OUTPUTS
Conversion Mode Data Format Unipolar mode Straight binary
Pseudobipolar mode Twos complement
Logic Levels
Output Low Voltage (VOL) Digital output current = +500 µA 0.4 V
Output High Voltage (VOH) Digital output current = −500 µA VIO − 0.3 V
POWER REQUIREMENTS
AVDD to AGND 3.15 5.5 V
LDO_IN to AGND Internal LDO enabled 2.4 5.5 V
Internal LDO disabled 0 V
VDD to AGND Internal LDO disabled 1.71 1.8 1.89 V
VIO to IOGND 1.14 1.98 V
POWER SUPPLY CURRENT9
Standby Current
AVDD AVDD = 5 V
Internal reference buffer disabled 160 nA
Internal reference buffer enabled 460 µA
LDO_IN LDO_IN = 5 V
Internal LDO enabled 9 µA
Internal LDO disabled 0.3 µA
VDD VDD = 1.8 V, internal LDO disabled
Internal reference buffer disabled 1.5 µA
Internal reference buffer enabled 5 µA
VIO VIO = 1.8 V 250 nA
AVDD Current (Conversion Mode) AVDD = 5 V
Internal Reference Buffer Disabled, Reference fS = 10 kSPS 680 nA
High-Z Mode Disabled, Analog Input High-Z Mode
Disabled
fS = 500 kSPS 26 µA
fS = 1 MSPS 52 µA
Internal Reference Buffer Disabled, Reference fS = 10 kSPS 13 µA
High-Z Mode Enabled, Analog Input High-Z Mode
Enabled
fS = 500 kSPS 0.64 0.73 mA
fS = 1 MSPS 1.28 1.46 mA
Internal Reference Buffer Enabled, Reference fS = 10 kSPS, REFIN = 4.096 V 450 µA
High-Z Mode Enabled, Analog Input High-Z Mode
Enabled
fS = 500 kSPS, REFIN = 4.096 V 1 1.14 mA
fS = 1 MSPS, REFIN = 4.096 V 1.5 1.78 mA
LDO_IN Current (Conversion Mode) LDO_IN = 5 V, internal LDO enabled
Reference High-Z Mode Disabled, Analog Input fS = 10 kSPS 52 µA
High-Z Mode Disabled
fS = 500 kSPS 2 mA
fS = 1 MSPS 4 mA
Reference High-Z Mode Enabled, Analog Input fS = 10 kSPS 64 µA
High-Z Mode Enabled
fS = 500 kSPS 2.6 3.3 mA
fS = 1 MSPS 5.2 6.6 mA
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Page10
Data Sheet AD4695/AD4696
SPECIFICATIONS
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
VDD Current (Conversion Mode) VDD = 1.8 V, internal LDO disabled
Reference High-Z Mode Disabled, Analog Input fS = 10 kSPS 42 µA
High-Z Mode Disabled
fS = 500 kSPS 2 mA
fS = 1 MSPS 4 mA
Reference High-Z Mode Enabled, Analog Input fS = 10 kSPS 53 µA
High-Z Mode Enabled
fS = 500 kSPS 2.5 3.2 mA
fS = 1 MSPS 5 6.4 mA
VIO Dynamic Current VIO = 1.8 V
Register Configuration Mode Streaming mode, SCK frequency (fSCK) = 50 MHz 125 µA
Conversion Mode Status bits enabled
fS = 10 kSPS 3.5 µA
fS = 500 kSPS 162 µA
fS = 1 MSPS 325 360 µA
POWER DISSIPATION9 AVDD = 5 V, VIO = 1.8 V
Standby Power Dissipation
Internal LDO Disabled VDD = 1.8 V, internal reference buffer disabled 4 µW
VDD = 1.8 V, internal reference buffer enabled 2.3 mW
Internal LDO Enabled LDO_IN = 5 V, internal reference buffer disabled 46 µW
LDO_IN = 5 V, internal reference buffer enabled 2.3 mW
Power Dissipation, Internal LDO Disabled LDO_IN = AGND, VDD = 1.8 V
Internal Reference Buffer Disabled, Reference fS = 10 kSPS 85 µW
High-Z Mode Disabled, Analog Input High-Z Mode
Disabled
fS = 500 kSPS 4 mW
fS = 1 MSPS 8 mW
Internal Reference Buffer Disabled, Reference fS = 10 kSPS 170 µW
High-Z Mode Enabled, Analog Input High-Z Mode
Enabled
fS = 500 kSPS 8 9.8 mW
fS = 1 MSPS 16 19.5 mW
Internal Reference Buffer Enabled, Reference fS = 10 kSPS, REFIN = 4.096 V 2.4 mW
High-Z Mode Enabled, Analog Input High-Z Mode
Enabled
fS = 500 kSPS, REFIN = 4.096 V 9.8 11.8 mW
fS = 1 MSPS, REFIN = 4.096 V 17.1 21.1 mW
Power Dissipation, Internal LDO Enabled LDO_IN = 5 V
Internal Reference Buffer Disabled, Reference fS = 10 kSPS 270 µW
High-Z Mode Disabled, Analog Input High-Z Mode
Disabled
fS = 500 kSPS 10.5 mW
fS = 1 MSPS 21 mW
Internal Reference Buffer Disabled, Reference fS = 10 kSPS 395 µW
High-Z Mode Enabled, Analog Input High-Z Mode
Enabled
fS = 500 kSPS 16.5 20.5 mW
fS = 1 MSPS 33 41.0 mW
Internal Reference Buffer Enabled, Reference fS = 10 kSPS, REFIN = 4.096 V 2.6 mW
High-Z Mode Enabled, Analog Input High-Z Mode
Enabled
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Page11
Timing Specifications
Data Sheet AD4695/AD4696
SPECIFICATIONS
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
fS = 500 kSPS, REFIN = 4.096 V 18.3 22.5 mW
fS = 1 MSPS, REFIN = 4.096 V 34.1 42.6 mW
Autocycle Mode Power Dissipation LDO_IN = 5 V, internal LDO enabled, autocycle mode
enabled
AC_CYC = 0x0 2.3 mW
AC_CYC = 0x7 0.2 mW
TEMPERATURE RANGE
Specified Performance TMIN to TMAX −40 +125 °C
1 See the Channel Configuration Options section for a detailed description of unipolar mode, pseudobipolar mode, and the channel pin assignment options.
2 IN+ and IN− represent the analog inputs connected to the positive and negative inputs of the AD4695/AD4696 ADC core via the internal multiplexer (see the Multiplexer
section and Channel Configuration Options section).
3 The analog input leakage current specification refers to the input current of the analog input pins during periods when the ADC is not performing conversions and the
analog input voltage is already settled.
4 Offset error and gain error specifications are taken with the offset and gain correction registers set to the default values, which correspond to no offset or gain correction.
See the Offset and Gain Correction section for more information.
5 %FS is the percentage of the ADC full scale (see the Transfer Function section for a definition of full scale).
6 The REFIN pin and internal reference buffer are only available on the WLCSP models of the AD4695/AD4696. All specifications and conditions regarding REFIN or the
internal reference buffer are therefore only relevant for WLCSP models.
7 The reference buffer turn-on time specification refers to the amount of time between the reference buffer being enabled and the REF voltage settling to 0.01% accuracy
(see the Internal Reference Buffer section).
8 REXT and CEXT refer to the resistor and capacitor, respectively, that make up the recommended external RC filters at the analog inputs (see the External RC Filter section).
9 For the power supply current and power dissipation specifications where analog input high-Z mode is enabled, analog input high-Z mode is set to be enabled for all
channels. The power consumption scales with the percentage of conversions performed with analog input high-Z mode enabled.
TIMING SPECIFICATIONS
AVDD = 3.15 V to 5.5 V, LDO_IN = 2.4 V to 5.5 V with internal LDO enabled, LDO_IN = AGND with internal LDO disabled, VDD = 1.71 V to
1.89 V with internal LDO disabled, VIO = 1.14 V to 1.98 V, AGND = REFGND = IOGND = 0 V, reference voltage (VREF) = 2.4 V to 5.1 V, fS = 1
MSPS for the AD4696, fS = 500 kSPS for the AD4695, digital output load capacitance = 20 pF, autocycle mode disabled, no active overvoltage
protection clamps, and TA = −40°C to +125°C, unless otherwise noted.
Table 2.
Parameter1 Symbol Min Typ Max Unit
Conversion Time tCONVERT 380 415 ns
Acquisition Time tACQ
Two-Cycle Command Mode, Standard Sequencer, or Advanced Sequencer Enabled
fS = 1 MSPS 715 ns
fS = 500 kSPS 1715 ns
Single-Cycle Command Mode2 Enabled
CNV Period (Time Between Conversions) tCYC
fS = 1 MSPS, Autocycle Mode Disabled 1000 ns
fS = 500 kSPS, Autocycle Mode Disabled 2000 ns
Autocycle Mode Enabled
AC_CYC = 0x0 8.5 10 11.5 μs
AC_CYC = 0x1 17 20 23 μs
AC_CYC = 0x2 34 40 46 μs
AC_CYC = 0x3 68 80 92 μs
AC_CYC = 0x4 85 100 115 μs
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Page12
Data Sheet AD4695/AD4696
SPECIFICATIONS
Table 2.
Parameter1 Symbol Min Typ Max Unit
AC_CYC = 0x5 170 200 230 μs
AC_CYC = 0x6 340 400 460 μs
AC_CYC = 0x7 680 800 920 μs
CNV High Time tCNVH 10 ns
CNV Low Time tCNVL 80 ns
CS High Time tCSBH 5 ns
CS Low to Digital Interface Ready Delay tEN 15 ns
CS High to SDO High Impedance Delay tCSBDIS 15 ns
SCK Period tSCK
Register Configuration Mode 40 ns
Conversion Mode 12.5 ns
SCK Low Time tSCKL
Register Configuration Mode 16 ns
Conversion Mode 5 ns
SCK High Time tSCKH
Register Configuration Mode 16 ns
Conversion Mode 5 ns
SDI Data Setup Time Prior to SCK Rising Edge tSSDI 2 ns
SDI Data Hold Time After SCK Rising Edge tHSDI 2 ns
SCK Falling Edge to Data Remains Valid Delay tHSDO 1.5 ns
SCK Falling Edge to Data Valid Delay tDSDO 10.5 ns
Last SCK Edge to CNV Rising Edge Delay tSCKCNV 80 ns
Last SCK Rising Edge to CS Rising Edge Delay tSCKCSB 1 ns
CNV Rising Edge to Busy Indicator Rising Edge (Busy Indicator Enabled on General-Purpose Pin) tCNVBSY 20 ns
CNV Rising Edge to Alert Indicator Transition (Alert Indicator Enabled on General-Purpose Pin) tCNVALT 425 ns
Busy Indicator Low Time, Autocycle Mode Enabled (Busy Indicator Enabled on General-Purpose Pin) tACBSY
AC_CYC = 0x0 8 µs
AC_CYC = 0x1 16.5 µs
AC_CYC = 0x2 33.5 µs
AC_CYC = 0x3 67.5 µs
AC_CYC = 0x4 84.5 µs
AC_CYC = 0x5 169 µs
AC_CYC = 0x6 339 µs
AC_CYC = 0x7 679 µs
Register Configuration Mode Setup Time tREGCONFIG 20 ns
RESET Low Time tRESETL 10 ns
Hardware Reset Delay (VDD Always Supplied) tHWR_DELAY 310 µs
Software Reset Delay tSWR_DELAY 310 µs
VDD Power-On Reset Delay tPOR_VDD 2 ms
VIO Power-On Reset Delay (VDD Supplied Externally) tPOR_VIO1 1.3 ms
LDO_IN Power-On Reset Delay tPOR_LDO 3.2 ms
VIO Power-On Reset Delay (VDD Supplied by Internal LDO) tPOR_VIO2 3 ms
LDO Wake-Up Command Power-On Reset Delay tWAKEUP_SW 3 ms
Hardware Reset Delay (Internal LDO Disabled) tWAKEUP_HW 3 ms
1 For all specifications, the relative voltages for the AVDD and REF inputs follow the operating conditions specified in the reference and power requirements sections of Table
1.
2 The acquisition time for single-cycle command mode depends on the sample rate and SCK frequency (see the Single-Cycle Command Mode section).
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Page13
Absolute Maximum Ratings、Thermal Resistance、Electrostatic Discharge (ESD) Ratings、ESD Ratings for AD4695/AD4696、ESD Caution
Data Sheet AD4695/AD4696
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating Table 4. Thermal Resistance
Analog Inputs Package Type θJA1 θJC2 Unit
INn,1 COM to REFGND −0.3 V to REF + 0.3 V CP-32-7 40.2 17.5 °C/W
Reference Inputs CP-36-5 41.8 0.1 °C/W
REF, REFIN to AGND, REFGND, IOGND −0.3 V to +6 V
REF to REFIN −6.3 V to +6.3 V 1 Simulated values are based on the JEDEC 2S2P thermal test board with
Supply Inputs nine thermal vias in a JEDEC natural convection environment. See JEDEC
AVDD, LDO_IN to AGND, REFGND, IOGND −0.3 V to +6 V JESD51.
VDD, VIO to AGND, REFGND, IOGND −0.3 V to +2.1 V 2 Simulated values are measured to the package top surface with a cold plate
AVDD to LDO_IN −6.3 V to +6.3 V attached directly to the package top surface.
AVDD, LDO_IN to REF −6.3 V to +6.3 V
VDD, VIO to AVDD, LDO_IN, REF −6.3 V to +2.4 V ELECTROSTATIC DISCHARGE (ESD) RATINGS
VDD to VIO −2.4 V to +2.4 V The following ESD information is provided for handling of ESD-sen-
Ground sitive devices in an ESD protected area only.
AGND, IOGND to REFGND −0.3 V to +0.3 V
AGND to IOGND −0.3 V to +0.3 V Human body model (HBM) per ANSI/ESDA/JEDEC JS-001.
Digital Inputs2 to IOGND −0.3 V to +6 V Field induced charged device model (FICDM) per ANSI/ESDA/JE-
Digital Outputs2 to IOGND −0.3 V to VIO + 0.3 V DEC JS-002.
Storage Temperature Range −65°C to +150°C
Junction Temperature 150°C ESD Ratings for AD4695/AD4696
Lead Temperature Soldering 260°C reflow, as per Table 5. AD4695/AD4696 32-Lead LFCSP
JEDEC J-STD-020 ESD Model Withstand Threshold (kV) Class
1 INn refers to the analog inputs, Pin IN0 through Pin IN15. HBM 4 3A
2 See the Pin Configuration and Function Descriptions section for a list of the FICDM 1.25 C3
digital input and digital output pins.
Table 6. AD4695/AD4696 36-Lead WLCSP
Stresses at or above those listed under Absolute Maximum Ratings ESD Model Withstand Threshold (kV) Class
may cause permanent damage to the product. This is a stress HBM 3 2
rating only; functional operation of the product at these or any other FICDM 1 C3
conditions above those indicated in the operational section of this
specification is not implied. Operation beyond the maximum operat- ESD CAUTION
ing conditions for extended periods may affect product reliability. ESD (electrostatic discharge) sensitive device. Charged devi-
THERMAL RESISTANCE ces and circuit boards can discharge without detection. Although
this product features patented or proprietary protection circuitry,
Thermal performance is directly linked to printed circuit board damage may occur on devices subjected to high energy ESD.
(PCB) design and operating environment. Careful attention to PCB Therefore, proper ESD precautions should be taken to avoid
thermal design is required. performance degradation or loss of functionality.
θJA is specified for worst case conditions and is the natural con-
vection junction-to-ambient thermal resistance measured in a one
cubic foot sealed enclosure, and θJC is the junction to case thermal
resistance.
Thermal resistance values specified in Table 4 were calculated
based on JEDEC specifications and must be used in compliance
with JESD51-12. The worst case junction temperature is reported.
θJA is highly dependent on the application and board layout. In
applications where high maximum power dissipation exists, close
attention to thermal board design is required. The θJA value can
vary depending on printed circuit board (PCB) material, layout, and
environmental conditions.
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Page14
Pin Configuration and Function Descriptions
Data Sheet AD4695/AD4696
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 2. AD4695/AD4696 LFCSP Pin Configuration
Table 7. AD4695/AD4696 LFCSP Pin Function Descriptions
Pin No. Mnemonic Type1 Description
1 IN5 AI Analog Input 5.
2 IN6 AI Analog Input 6.
3 IN7 AI Analog Input 7.
4 COM AI Common Channel Input. IN0 to IN15 can be paired with COM for the ADC core to sample the differential voltage between them.
COM is nominally tied to signal ground (unipolar mode) or VREF/2 (pseudobipolar mode). See the Channel Configuration Options
section for a detailed description on pairing inputs, unipolar mode, and pseudobipolar mode.
5 IN8 AI Analog Input 8.
6 IN9 AI Analog Input 9.
7 IN10 AI Analog Input 10.
8 IN11 AI Analog Input 11.
9 IN12 AI Analog Input 12.
10 IN13 AI Analog Input 13.
11 IN14 AI Analog Input 14.
12 IN15 AI Analog Input 15.
13 AGND P Analog Supply Ground. AVDD, LDO_IN, and VDD are referenced to AGND.
14 AVDD P Analog Power Supply. AVDD is nominally 3.15 V to 5.5 V. Decouple AVDD to AGND with a local 100 nF capacitor.
15 LDO_IN P Internal LDO Input. LDO_IN is nominally 2.4 V to 5.5 V when the internal LDO is enabled. Decouple LDO_IN to AGND with a
local 100 nF capacitor. If powering VDD with an external 1.8 V rail, tie LDO_IN to AGND. See the Internal LDO section for more
information.
16 VDD P ADC Core Power Supply. VDD is nominally 1.8 V. VDD must be decoupled with a local 100 nF capacitor to AGND. When the internal
LDO is enabled, VDD is internally generated. Disable the internal LDO when supplying VDD from an external source.
17 RESET DI Hardware Reset Input. Drive RESET low to perform a hardware reset of the device and reset the register states to the default values
(see the Device Reset section).
18 VIO P Input/Output Interface Digital Power. VIO is nominally the same supply as the host interface (for example, 1.2 V to 1.8 V). Decouple
VIO to IOGND with a local 100 nF capacitor.
19 IOGND P Input/Output Interface Digital Supply Ground. VIO is referenced to IOGND.
20 BSY_ALT_GP0 DI/DO General-Purpose Pin 0. On the LFCSP option, BSY_ALT_GP0 can be configured to function as a general-purpose input/output
(GPIO), the threshold detection alert indicator, the busy indicator, or the second serial data output in dual-SDO mode (see the
General-Purpose Pins section).
21 SDO DO Serial Data Output. When the device is configured in register configuration mode, SDO is used to read the configuration register data
during SPI read transactions. When the device is configured in conversion mode, SDO is used to read the conversion results. Data
output is synchronized to the falling edge of SCK.
22 SCK DI Serial Data Clock Input. SCK is used to clock out data on SDO and clock in data on SDI while the device is configured in either
register configuration mode or conversion mode.
23 SDI DI Serial Data Input. When the device is configured in register configuration mode, SDI is used to perform SPI read and write
transactions to access the configuration registers. In conversion mode, SDI receives 5-bit commands from the digital host, as shown
in Table 18.
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Page15
Data Sheet AD4695/AD4696
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Table 7. AD4695/AD4696 LFCSP Pin Function Descriptions
Pin No. Mnemonic Type1 Description
24 CNV DI Convert Input. When the device is configured in conversion mode, a rising edge on CNV initiates a conversion of the selected analog
input. The AD4695/AD4696 can interface to a 4-wire SPI by tying CNV to CS. See the Digital Interface Operation section for more
information.
25 CS DI Chip Select Input. When configured in register configuration mode, the CS pin frames the SPI read and write transactions that
access the configuration registers. When the device is configured in conversion mode, CS can either be held low throughout the
entire conversion or used to frame SPI transactions that read back conversion results. The AD4695/AD4696 can interface to a 4-wire
SPI by tying CNV to CS. See the Digital Interface Operation section for more information.
26 REFGND P Reference Ground. REF is referenced to REFGND. IN0 to IN15 can be paired with REFGND to the ADC core to sample the
differential voltage between them. See the Channel Configuration Options section for a detailed description on pairing inputs.
27 REF AI Reference Input. VREF must be provided by an external precision reference voltage between 2.4 V and 5.1 V. The REF pin must be
decoupled with a minimum 1 μF capacitor for optimal operation. See the Voltage Reference Input section for more information.
28 IN0 AI Analog Input 0.
29 IN1 AI Analog Input 1.
30 IN2 AI Analog Input 2.
31 IN3 AI Analog Input 3.
32 IN4 AI Analog Input 4.
33 EPAD NC Exposed Pad. The exposed pad is not connected internally. For increased reliability of the solder joints, it is recommended that the
pad be soldered to the system ground plane.
1 AI is analog input, P is power, DI is digital input, DO is digital output, and NC is no internal connection.
Figure 3. AD4695/AD4696 WLCSP Pin Configuration
Table 8. AD4695/AD4696 WLCSP Pin Function Descriptions
Pin No. Mnemonic Type1 Description
A1 SDI DI Serial Data Input. When the device is configured in register configuration mode, SDI is used to perform SPI read and write
transactions to access the configuration registers. In conversion mode, SDI receives 5-bit commands from the digital host, as
shown in Table 18.
A2 CS DI Chip Select Input. When configured in register configuration mode, the CS pin frames the SPI read and write transactions that
access the configuration registers. When the device is configured in conversion mode, CS can either be held low throughout
the entire conversion or used to frame SPI transactions that read back conversion results. The AD4695/AD4696 can interface
to a 4-wire SPI by tying CNV to CS. See the Digital Interface Operation section for more information.
A3 REFIN AI Internal Reference Buffer Input. The internal reference buffer can be used to buffer the reference voltage source and drive the
REF pin internally. When the internal reference buffer is enabled, REFIN must be driven by an external precision reference
source between 2.4 V and 5.1 V. When not using the internal reference buffer, REFIN must be tied to REF. See the Internal
Reference Buffer section for more information.
A4 IN0 AI Analog Input 0.
A5 IN2 AI Analog Input 2.
A6 IN3 AI Analog Input 3.
B1 SDO DO Serial Data Output. When the device is configured in register configuration mode, SDO is used to read the configuration
register data during SPI read transactions. When the device is configured in conversion mode, SDO is used to read the
conversion results. Data output is synchronized to the falling edge of SCK.
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Page16
Data Sheet AD4695/AD4696
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Table 8. AD4695/AD4696 WLCSP Pin Function Descriptions
Pin No. Mnemonic Type1 Description
B2 CNV DI Convert Input. When the device is configured in conversion mode, a rising edge on CNV initiates a conversion of the selected
analog input. The AD4695/AD4696 can interface to a 4-wire SPI by tying CNV to CS. See the Digital Interface Operation
section for more information.
B3 REF AI Reference Input. VREF must be provided by an external precision reference voltage between 2.4 V and 5.1 V. The REF pin
must be decoupled with a minimum 1 μF capacitor for optimal operation. See the Voltage Reference Input section for more
information.
B4 IN1 AI Analog Input 1.
B5 IN4 AI Analog Input 4.
B6 IN5 AI Analog Input 5.
C1 GP2 DI/DO General-Purpose Pin 2. Can be configured to function as a general-purpose input/output, the threshold detection alert indicator,
or the third serial data output in quad-SDO mode (see the General-Purpose Pins section).
C2 SCK DI Serial Data Clock Input. SCK is used to clock out data on SDO and clock in data on SDI while the device is configured in either
register configuration mode or conversion mode.
C3 REFGND P Reference Ground. REF is referenced to REFGND. IN0 to IN15 can be paired with REFGND to the ADC core to sample the
differential voltage between them. See the Channel Configuration Options section for a detailed description on pairing inputs.
C4 COM AI Common Channel Input. IN0 to IN15 can be paired with COM for the ADC core to sample the differential voltage between
them. COM is nominally tied to signal ground (unipolar mode) or VREF/2 (pseudobipolar mode). See the Channel Configuration
Options section for a detailed description on pairing inputs, unipolar mode, and pseudobipolar mode.
C5 IN6 AI Analog Input 6.
C6 IN7 AI Analog Input 7.
D1 BSY_ALT_GP0 DI/DO General-Purpose Pin 0. On the WLCSP option, BSY_ALT_GP0 can be configured to function as a general-purpose input/output
(GPIO), the threshold detection alert indicator, or the busy indicator (see the General-Purpose Pins section).
D2 GP1 DI/DO General-Purpose Pin 1. Can be configured to function as a general-purpose input/output, or the second serial data output in
dual- and quad-SDO modes (see the General-Purpose Pins section).
D3 RESET DI Hardware Reset Input. Drive RESET low to perform a hardware reset of the device and reset the register states to the default
values (see the Device Reset section).
D4 AGND P Analog Supply Ground. AVDD, LDO_IN, and VDD are referenced to AGND.
D5 IN9 AI Analog Input 9.
D6 IN8 AI Analog Input 8.
E1 VIO P Input/Output Interface Digital Power. VIO is nominally the same supply as the host interface (for example, 1.2 V to 1.8 V).
Decouple VIO to IOGND with a local 100 nF capacitor.
E2 GP3 DI/DO General-Purpose Pin 3. Can be configured to function as a general-purpose input/output, the busy indicator, or the fourth serial
data output in quad-SDO mode (see the General-Purpose Pins section).
E3 IOGND P Input/Output Interface Digital Supply Ground. VIO is referenced to IOGND.
E4 IN14 AI Analog Input 14.
E5 IN11 AI Analog Input 11.
E6 IN10 AI Analog Input 10.
F1 VDD P ADC Core Power Supply. VDD is nominally 1.8 V. VDD must be decoupled with a local 100 nF capacitor to AGND. When the
internal LDO is enabled, VDD is internally generated. Disable the internal LDO when supplying VDD from an external source.
F2 LDO_IN P Internal LDO Input. LDO_IN is nominally 2.4 V to 5.5 V when the internal LDO is enabled. Decouple LDO_IN to AGND with a
local 100 nF capacitor. If powering VDD with an external 1.8 V rail, tie LDO_IN to AGND. See the Internal LDO section for more
information.
F3 AVDD P Analog Power Supply. AVDD is nominally 3.15 V to 5.5 V. Decouple AVDD to AGND with a local 100 nF capacitor.
F4 IN15 AI Analog Input 15.
F5 IN13 AI Analog Input 13.
F6 IN12 AI Analog Input 12.
1 AI is analog input, P is power, DI is digital input, DO is digital output, and NC is no internal connection.
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Page17
Typical Performance Characteristics
Data Sheet AD4695/AD4696
TYPICAL PERFORMANCE CHARACTERISTICS
AVDD = LDO_IN = 5 V, VIO = 1.8 V, VREF = 5 V, fSCK = 50 MHz, unipolar mode, analog input high-Z mode enabled, reference input high-Z
mode enabled, internal LDO enabled, fS = 1 MSPS for the AD4696, fS = 500 kSPS for the AD4695, no active clamps, autocycle mode disabled,
OSR = 1, and TA = 25°C, unless otherwise specified.
Figure 4. INL vs. Code, VREF = 5 V Figure 7. DNL vs. Code, VREF = 5 V
Figure 5. INL vs. Code, VREF = 4.096 V Figure 8. DNL vs. Code, VREF = 4.096 V
Figure 6. INL vs. Code, VREF = 2.5 V Figure 9. DNL vs. Code, VREF = 2.5 V
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Page18
Data Sheet AD4695/AD4696
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 10. Histogram of a DC Input at Code Center, OSR = 1 Figure 13. Histogram of a DC Input at Code Transition, OSR = 1
Figure 11. Histogram of a DC Input at Code Center, OSR = 64 Figure 14. Histogram of a DC Input at Code Transition, OSR = 64
Figure 12. Dynamic Range vs. OSR Figure 15. 1/f Noise (0.1 Hz to 10 Hz Bandwidth), 50 kSPS, 2500 Samples
Averaged per Reading
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Page19
Data Sheet AD4695/AD4696
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 16. Fast Fourier Transform (FFT), fIN = 1 kHz, VREF = 5 V, OSR = 1 Figure 19. FFT, fIN = 1 kHz, VREF = 2.5 V, OSR = 1
Figure 17. FFT, fIN = 1 kHz, VREF = 5 V, OSR = 64 Figure 20. FFT, fIN = 1 kHz, VREF = 2.5 V, OSR = 64
Figure 18. SNR, SINAD, and THD vs. Input Frequency
Figure 21. Analog Input Voltage Step with Analog Input High-Z Mode
Disabled and Enabled
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Page20
Data Sheet AD4695/AD4696
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 22. SNR, SINAD, and Effective Number of Bits (ENOB) vs. VREF, fIN = 1 Figure 25. THD and SFDR vs. VREF, fIN = 1 kHz
kHz
Figure 26. THD and SFDR vs. Temperature, fIN = 1 kHz
Figure 23. SNR, SINAD, and ENOB vs. Temperature, fIN = 1 kHz
Figure 27. SNR, SINAD vs. Number of Active Clamps, Reduced Current Mode
Figure 24. SNR, SINAD vs. Number of Active Clamps, Reduced Current Mode Enabled
Disabled
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